The study of new semiconducting materials, high temperature superconductors, new photovoltaic
devices, and organic electronic materials typically requires low level sourcing and measurement
because the materials are often nanostructures. Types of ultra-small structures include
2-dimensional (2D) nano electronic structures, quantum dots, multi-atomic layer heterostructures,
and organic semiconductor structures. These extremely small structures are subject to thermal
dissipation damage. As device structures get increasingly smaller, these small structures can only
tolerate extremely low stimulus currents and voltages, which reduce measurable signals close to
the noise floor of typical instrumentation and experimental setups. The resulting measurements
needed to fully characterize these structures are therefore very low-level signals and thus are
often contaminated with significant levels of power line, thermal, and other types of ambient noise
signals.